AFM IT Terminology Abbreviation

Atomic Force Microscope

An instrument that uses atomic forces between a sample and a sharp scanning needle tip to image surfaces to molecular accuracy by mechanically probing their surface contours; the AFM measures the tiny upward and downward motions of the tip as the tip is dragged over the surface, producing an atomic-resolution topographic map of the surface. The AFM has also been used to physically manipulate individual molecules.