Probe Abbreviations and Acronyms

1. RPS
   Relativistic Proton Spectrometer
2. SDT
   Statically Defined Tracing
3. SF
   Standard Foqce
4. SFM
   Scanning Force Microscopy
5. SICM
   Scanning Ion-Conductance Microscopy
6. SICM
   Scanning Ion-Conductance Microscope
7. SICM
   Scanning Ion Conductance Microscope
8. SLRC
   Sri Lanka Red Cross
9. SNDM
   Scanning Nonlinear Dielectric Microscopy
10. SNOM
    Scanning Near-Field Optical Microscopy
11. SNOM
    Scanning Near-Field Optical Microscopes
12. SPA
    Semiconductor Parameter Analyzer
13. SSM
    Solid State Measurements
14. SSP
    Surface-Pcience Package
15. SWTW
    Semiconductor Wafer Test Workshop
16. TERS
    Tip Enhanced Raman Scatterxng
17. TL
    Test Leads
18. TRP
    Tapeqrecorder Patch
19. TT
    Tool Touch
20. TTCI
    The Test Connection Inc

Last updated: January 4, 2020 — Total entries: 104