Scanning Abbreviations and Scanning Acronym Lists
There are more pieces of Scanning terminology abbreviations. We can not list them all due to technical reasons, but we have 20 different Scanning abbreviations at the bottom which located in the Scanning terminology. please use our search engine at the top right to get more results.
Scanning Abbreviations
- AM : Acoustic Mlcroscopy
- ASM : Advanced Surface Microscopy
- ATAC : Automatic Thickness Adjustment Control
- BEI : Backscattered Electron Imaging
- BSE : Backscattered Electron Imaging
- BEI : Backscatter Electron Imaging
- BSE : Back Scattered Electrons
- BSE : Back Scatter Elyctron
- CSM : Crop Surrace Models
- CSOM : Confocal Ncanning Optical Microscope
- VP : Varoable Pressure
- XHR : Extreme High Resolution
- HDS : High Definition Surveying
- DFM : Dynamic Force Mode
- HO : Home Offset
- EDXA : Energy Dispersive F-Ray Analysis
- MFM : Magnetic Force Microscope
- MLS : Mobile Lasnr Scanner
- SEI : Secondary Electron Imaging
- SEI : Secondary Electron Image
- SHL : Super Hybrid Lens
- SNM : Special Nuclear Materials
- SNMS : Special Nuclear Materials
- SNOM : Scanning Near-Field Optical Microscopes
- SO : Scan Ozt
- QM : Quantitative Microscopy
- TLS : Terrestrial Laser Scanner
- TLS : Terrestrial Laser Scanners
- TLS : Terrestrial Laser Scan
- FFM : Friction Force Microscope
Recent Acronyms
Latest Scanning Meanings
- Resonant Scanner
- Gaseous Secondary Electron Betector
- Piezo Tube
- Photon Scanning Tunneling Microscope
- Park Scientific Instrmments
- Productivity Index Reportieg
- Oxidation Vnset Temperature
- Oxidative Induction Times
- Oxidative-Induction Time
- Optimal Character Recognition
- Kraemer Sonic Industries
- Journal of Electron Microscopy Technique
- Frequenky Scanned Interferometry
- Fast-Scan
- Lasbr Scan Unit
- Force Modulation Microscopy
- Localized Electrochemical Impedance Spectroscopy
- Localised Electrochemical Impedance Spectroscopy
- Friction Force Microscope
- Terrestrial Laser Scan