AES has various meanings in the Materials Analysis category. Discover the full forms, definitions, and usage contexts of AES in Materials Analysis.
Auger Electron Spectroscopy is an excellent complementary technique to SEM(Scanning Electron Microscopy) in that AES can provide elemental maps with significantly better spatial resolution and surfaces sensitivity than SEM/EDS. The typical information depth for auger is in the range of 30-60A, with a spatial resolution in the 10 nm range.
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