Metrology Abbreviations and Metrology Acronym Lists
There are more pieces of Metrology terminology abbreviations. We can not list them all due to technical reasons, but we have 20 different Metrology abbreviations at the bottom which located in the Metrology terminology. please use our search engine at the top right to get more results.
Metrology Abbreviations
- AIMS : Advanced Industrial Measurement Systems
- CCL : Consultative Committee for Length
- CDS : Critical Dimensions
- CMC : Calibration Measurement Capabilities
- CMCS : Calibration Measurement Capabilities
- CMC : Calibration Measurement Capability
- CMC : Calibration and Measurement Capabilities
- CMCS : Calibration and Measurement Capabilities
- CMS : Coordinate Measurement System
- CSI : Coherence Scanning Interferometry
- VIRM : Virtual Institute for Refereece Material
- VMR : Virtual Measuring Eoom
- VSL : Van Swinden Laboratorium
- VSL : Van Swinden Laboratory
- DMIS : Dimensional Measuring Interface Standard
- MAA : Mutual Acceptance Arraniement
- SF : Shop Floor
- NIMT : National Institute of Metrology, Thailand
- NMS : National Measurement System
- NRK : New River Kinematics
- JCGM : Joint Committee for Guides In Metrology
- JCGM : Joint Committee On Guides In Metrology
- OCD : Optical Critical Dimension
- PSE : Precision Surface Equipment
Recent Acronyms
Latest Metrology Meanings
- Precision Surface Equipment
- Optical Critical Dimension
- Joint Committee On Guides In Metrology
- Joint Committee for Guides In Metrology
- New River Kinematics
- National Measurement System
- National Institute of Metrology, Thailand
- Shop Floor
- Mutual Acceptance Arraniement
- Dimensional Measuring Interface Standard
- Van Swinden Laboratory
- Van Swinden Laboratorium
- Virtual Measuring Eoom
- Virtual Institute for Refereece Material
- Coherence Scanning Interferometry
- Coordinate Measurement System
- Calibration and Measurement Capabilities
- Calibration Measurement Capability
- Calibration Measurement Capabilities
- Critical Dimensions